40th International Symposium for Testing and Failure Analysis (ISTFA 2014): http://www.asminternational.org/content/Events/istfa/

40th International Symposium for Testing and Failure Analysis (ISTFA 2014)
November 09 - 13, 2014

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Dr. Euan Ramsay

DCG Systems
3400 West Warren Avenue
Fremont, CA
USA 94538

Papers:
Novel NIR Camera with Extended Sensitivity and Low Noise for Photon Emission Microscopy of VLSI Circuits Ultra-Low Voltage TRE Measurements from 32 nm SOI CMOS Integrated Circuits

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General Information

November 09 - 13, 2014


Houston, TX