40th International Symposium for Testing and Failure Analysis (ISTFA 2014): http://www.asminternational.org/content/Events/istfa/

40th International Symposium for Testing and Failure Analysis (ISTFA 2014)
November 09 - 13, 2014

  • Home
  • Start
  • Browse
    • Browse by Day
  • At-A-Glance
  • Author Index

Dr. Herve Deslandes

Applications Engineering Manager
DCG Systems
45900 Northport Loop E.
Fremont, CA
USA 94538

Papers:
Novel NIR Camera with Extended Sensitivity and Low Noise for Photon Emission Microscopy of VLSI Circuits Introduction of Spectral Mapping through Transmission Grating, Derivative Technique of Photon Emission

  • Home
  • Start
  • Browse
    • Browse by Day
  • At-A-Glance
  • Author Index
General Information

November 09 - 13, 2014


Houston, TX