FIB User Group

Thursday, November 13, 2014: 3:45 PM-5:45 PM
Grand Ballroom B (George R. Brown Convention Center )
3:45 PM
Enabling EFI, EFA and PFA with Plasma FIB - Large Area sampling for X-ray Tomography and Batch Lamella Preparation, By Ron Kelly, FEI Company
4:25 PM
Elimination of ESD damage during FIB operations, By Valery Ray, NISP Lab, University of Maryland
5:05 PM
FIB line resistivity calculations, there’s an app for that, By Michael DiBattista, Qualcomm Incorporated
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