27.6
Symptom or Cause? A Case Study

Wednesday, November 4, 2015
Exhibit Hall D (Oregon Convention Center )
Ms. Anuradha Swaminathan , nVIDIA Corporation, Santa Clara, CA
Dr. Joy Y. Liao , nVIDIA Corporation, Santa Clara, CA
Mr. Howard Lee Marks , nVIDIA Corporation, Santa Clara, CA

Summary:

This paper shows how Continuous Wave Laser Voltage Probing(CW-LVP) in combination with Soft Defect Localization(SDL) points to defect indicators and symptoms.When analysts follow the data,isolation of the cause of the failure becomes possible.
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