14.3
Materials analyses for parts validation

Wednesday, November 4, 2015: 5:35 PM
Meeting Room D137 & 138 (Oregon Convention Center )
Dr. W. John Wolfgong , Raytheon, McKinney, TX
Mr. James izzo , Raytheon, McKinney, TX

See more of: Detecting Counterfeit Microelectronics II
See more of: Technical Program