14
Detecting Counterfeit Microelectronics II

Wednesday, November 4, 2015: 4:45 PM-6:00 PM
Meeting Room D137 & 138 (Oregon Convention Center )
Session Chairs:  Mr. Robert Champaign, FA Lab, Raytheon Network Centric Systems, McKinney, TX and Mr. Joe Colangelo, Raytheon, McKinney, TX
4:45 PM
14.1
Techniques for Reverse Engineering and Functionality Extraction of Mixed-Signal ICs for Security Applications
Dr. Franco Stellari, IBM Research; Dr. Chung-Ching Lin, IBM T.J. Watson Research Center; Lynne Gignac, IBM T.J. Watson Research Center; Dr. Raphael Robertazzi, IBM Research; Alan Weger, IBM Research; Dr. Peilin Song, IBM T.J. Watson Research Center
5:10 PM
14.2
WISE and ICARUS: New X-Ray Algorithms to Improve the Detection of Counterfeit Components
Dr. Bill Cardoso, Creative Electron
5:35 PM
14.3
Materials analyses for parts validation
Dr. W. John Wolfgong, Raytheon; Mr. James izzo, Raytheon
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