2.2
Soft defect Localization on Analog and Mixed-signal ICs Using an OBIRCH Tool

Monday, November 2, 2015: 11:10 AM
Meeting Room D135 & 136 (Oregon Convention Center )
Mr. Chunlei Wu , Freescale Semiconductor (China) Limited, Tianjin, China
Mr. Yi Che , Freescale Semiconductor(China) Limited, Tianjin, China
Xiaocui Li , Freescale Semiconductor(China) Limited, Tianjin, China

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See more of: Technical Program