2
Fault Isolation I

Monday, November 2, 2015: 10:45 AM-12:00 PM
Meeting Room D135 & 136 (Oregon Convention Center )
Session Chairs:  Dr. Michael Bruce, Consultant, Austin, TX and Dr. Paiboon Tangyunyong, Sandia National Laboratories, Albuquerque, NM
10:45 AM
2.1
Pulsed laser stimulation coupled with optical failure analysis technique: a methodology for helping space application electronics designers
Dr. Guillaume Bascoul, Intraspec Technologies; Dr. Kevin Sanchez, Centre National d'Etudes Spatiales (CNES)
11:10 AM
2.2
Soft defect Localization on Analog and Mixed-signal ICs Using an OBIRCH Tool
Mr. Chunlei Wu, Freescale Semiconductor (China) Limited; Mr. Yi Che, Freescale Semiconductor(China) Limited; Xiaocui Li, Freescale Semiconductor(China) Limited
11:35 AM
2.3
Combinational Logic Analysis using Laser Voltage Probing
Mr. Venkat Ravikumar, Advanced Micro Devices - Singapore Pte Ltd; S.L. Phoa, Advanced Micro Devices - Singapore Pte Ltd; Mr. W lua, Advanced Micro Devices - Singapore Pte Ltd; Ms. YX Seah, Advanced Micro Devices - Singapore Pte Ltd1; Mr. Gopinath ranganathan, Advanced Micro Devices - Singapore Pte Ltd1
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