41st International Symposium for Testing and Failure Analysis (November 1 - 5, 2015)
November 01 - 05, 2015
Menu
Home
Start
Browse
Browse by Day
At-A-Glance
Author Index
6.1
Alleviating Sample Charging during FIB Operation
Monday, November 2, 2015: 2:15 PM
Meeting Room D137 & 138 (Oregon Convention Center )
Dr. Qing Liu
,
Nanyang Technological University, Singapore, Singapore
Ms. H. B. Kor
,
Nanyang Technological University, Singapore, Singapore
Ms. Y. W. Siah
,
Nanyang Technological University, Singapore, Singapore
Prof. Chee Lip Gan
,
Nanyang Technological University, Singapore, Singapore
See more of:
FIB Circuit Analysis and Edit
See more of:
Technical Program