2.3
Combinational Logic Analysis using Laser Voltage Probing

Monday, November 2, 2015: 11:35 AM
Meeting Room D135 & 136 (Oregon Convention Center )
Mr. Venkat Ravikumar , Advanced Micro Devices - Singapore Pte Ltd, Singapore, Singapore
S.L. Phoa , Advanced Micro Devices - Singapore Pte Ltd, Singapore, Singapore
Mr. W lua , Advanced Micro Devices - Singapore Pte Ltd, Singapore, Singapore
Ms. YX Seah , Advanced Micro Devices - Singapore Pte Ltd1, Singapore, Singapore
Mr. Gopinath ranganathan , Advanced Micro Devices - Singapore Pte Ltd1, Singapore, Singapore

Summary:

Laser Voltage Probing (LVP) using continuous-wave near infra-red lasers are popular for failure analysis, design and test debug. LVP waveforms provide information on the logic state of the circuitry. This paper aims to explain the waveforms observed from combinational circuitries and use it to reinterpret the truth table
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