41st International Symposium for Testing and Failure Analysis (November 1 - 5, 2015)
November 01 - 05, 2015
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33.1
TEM sample preparation tricks for Advanced DRAMs
Wednesday, November 4, 2015
Exhibit Hall D (Oregon Convention Center )
Ms. Ching-Shan Sung
,
Inotera Memories, Inc., Taoyuan, Taiwan
Ms. Hsiu-Ting Lee
,
Inotera Memories, Inc., Taoyuan, Taiwan
Dr. Jian Shing Luo
,
Inotera Memories, Inc., Taoyuan, Taiwan
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