33
Sample Preparation and Device Deprocessing - Posters

Wednesday, November 4, 2015: 1:30 PM-3:30 PM
Exhibit Hall D (Oregon Convention Center )
Session Chairs:  Mr. Roger Alvis, FEI Company, Hillsboro, OR and Mr. Jake E. Klein, Quality, Texas Instruments, Tucson, AZ
33.1
TEM sample preparation tricks for Advanced DRAMs
Ms. Ching-Shan Sung, Inotera Memories, Inc.; Ms. Hsiu-Ting Lee, Inotera Memories, Inc.; Dr. Jian Shing Luo, Inotera Memories, Inc.
33.2
Selective Etching of Highly-p-doped Si Substrate Using Low-p-doped Si epi as an Etch Stop Layer
Mrs. Valentina Korchnoy, Intel Israel (74) Ltd
33.3
A More Rapid Approach in Revealing the Physical Status of Polyfuses and Thin Film Fuses in a Multi-Layer Integrated Circuit
Mr. Jason H. Lagar, Analog Devices Gen. Trias, Inc., Philippines; Mr. Rudolf A. Sia, Analog Devices Gen. Trias Inc., Philippines; Ms. Melanie S. Cajita, Analog Devices Gen. Trias, Inc., Philippines
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