41st International Symposium for Testing and Failure Analysis (November 1 - 5, 2015)
November 01 - 05, 2015
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12.1
3D Integrated Power – A Discrete Perspective
Wednesday, November 4, 2015: 3:30 PM
Meeting Room D137 & 138 (Oregon Convention Center )
Mr. Ian Kearney
,
Texas Instruments, Bethlehem, PA
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3D Device Failure Analysis II
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Technical Program