12.2
CANCELLED - Imaging techniques comparison for advanced 3Di devices characterization

Wednesday, November 4, 2015: 3:55 PM
Meeting Room D137 & 138 (Oregon Convention Center )
Dr. Frederic Lorut , STMicroelectronics, Crolles, France
Dr. Nicolas Hotellier , STMicroelectronics, Crolles, France
Dr. Sandrine Lhostis , STMicroelectronics, Crolles, France
Dr. Fabienne Ponthenier , STMicroelectronics, Crolles, France

See more of: 3D Device Failure Analysis II
See more of: Technical Program