5
Fault Isolation II

Monday, November 2, 2015: 1:50 PM-3:30 PM
Meeting Room D139 & 140 (Oregon Convention Center )
Session Chairs:  Dr. Michael Bruce, Consultant, Austin, TX and Dr. Paiboon Tangyunyong, Validation and Failure Analysis, Sandia National Laboratories, Albuquerque, NM
1:50 PM
5.1
Comparison of Photon and Thermal Emission microscopy for Dynamic Fault Isolation
Dr. SH Goh, GLOBALFOUNDRIES
2:15 PM
5.2
Unique Approaches to Isolate Nano-scale Defect in Snake-Comb Test Structure
Dr. Sujing Xie, Maxim Integrated; Mr. Nathan Wang, Maxim Integrated; Ms. Chaoying Chen, Maxim Integrated; Ms. Qindi Wu, Maxim Integrated
2:40 PM
5.3
Optical Fault Isolation and Nanoprobing Techniques for the 10nm Technology Node and Beyond
Dr. Martin von Haartman, Intel Corporation; Dr. Samia N Rahman, Intel Corporation; Dr. Satyaki Ganguly, Intel Corporation; Dr. Jai Verma, Intel Corporation; Dr. Ahmad Umair, Intel Corporation; Dr. Tristan Deborde, Intel Corporation
3:05 PM
5.4
Device Ioff Mapping: Analysis of Ring Oscillator by Optical Beam Induced Resistance Change
Mr. Gregory M. Johnson, GLOBALFOUNDRIES; Mr. Christopher D'Aleo, IBM; Dr. Ziyan Xu, IBM
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