10.2
Analyzing the Impact of X-ray Tomography for Non-destructive Counterfeit Detection

Tuesday, November 3, 2015: 3:20 PM
Meeting Room D137 & 138 (Oregon Convention Center )
Mr. Halit Dogan , University of Connecticut, Storrs, CT
Mr. Mahbub Alum , University of Florida, Gainesville, FL
Dr. Navid Asadizanjani , University of Florida, Gainesville, FL
Dr. Sina Shahbazmohamadi, PhD , Manhattan College, Riverdale, NY
Prof. Domenic Forte, PhD , University of Florida, Gainesville, FL
Prof. Mark Tehranipoor, PhD , University of Florida, Gainesville, FL

See more of: Detecting Counterfeit Microelectronics I
See more of: Technical Program