10
Detecting Counterfeit Microelectronics I

Tuesday, November 3, 2015: 2:55 PM-5:00 PM
Meeting Room D137 & 138 (Oregon Convention Center )
Session Chairs:  Mr. Robert Champaign, FA Lab, Raytheon Network Centric Systems, McKinney, TX and Mr. Joe Colangelo, FA Lab, Raytheon Network Centric Systems, McKinney, TX
2:55 PM
10.1
Update on Draft SAE AS6171 Standard - Tools and Techniques for Detection and Mitigation of Counterfeit Electronics
Dr. William E. Vanderlinde, Laboratory for Physical Sciences; Mr. Bhanu P. Sood, CALCE, University of Maryland
3:20 PM
10.2
Analyzing the Impact of X-ray Tomography for Non-destructive Counterfeit Detection
Mr. Halit Dogan, University of Connecticut; Mr. Mahbub Alum, University of Florida; Dr. Navid Asadizanjani, University of Florida; Dr. Sina Shahbazmohamadi, PhD, Manhattan College; Prof. Domenic Forte, PhD, University of Florida; Prof. Mark Tehranipoor, PhD, University of Florida
3:45 PM
10.3
Non-destructive PCB Reverse Engineering Using X-ray Micro Computed Tomography
Dr. Navid Asadizanjani, University of Florida; Dr. Sina Shahbazmohamadi, PhD, Manhattan College; Prof. Mark Tehranipoor, PhD, University of Florida; Prof. Domenic Forte, PhD, University of Florida
4:10 PM
10.4
2010-2015: The Evolving Counterfeit Machine
Mr. Tom Sharpe, SMT Corp.
4:35 PM
10.5
Functional Electronic Clones – the most dangerous NEW counterfeit threat facing the ENTIRE Electronics Industry today
Mr. Tom Sharpe, SMT Corp.
See more of: Technical Program
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