19.3
The Changing Role of Advanced Sample Preparation in X-ray Inspection Supporting 2.5D and 3D Sample Failure Analysis

Thursday, November 5, 2015: 11:15 AM
Meeting Room D139 & 140 (Oregon Convention Center )
Ms. Rosanne M. LaVoy , SVXR, San Jose, CA
Mr. Matthew M. Mulholland , Intel Corporation, Santa Clara, CA
Mr. Scott Silverman , Varioscale, Inc, San Marcos, CA

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