19
Sample Preparation and Device Deprocessing I

Thursday, November 5, 2015: 10:25 AM-11:40 AM
Meeting Room D139 & 140 (Oregon Convention Center )
Session Chairs:  Mr. Izak Kapilevich, DCG Systems, Fremont, CA and Dr. Sam Subramanian, Freescale Semiconductor, Inc., Austin, TX
10:25 AM
19.1
A Simple Method to Fabricate a Tunable In-Situ SIL
Mr. Mark Kimball, Maxim Integrated
10:50 AM
19.2
Adaptive Grinding and Polishing of Silicon Integrated Circuits to Ultrathin Remaining Thickness
Dr. Robert D. Chivas, Varioscale, Inc; Mr. Scott Silverman, Varioscale, Inc; Dr. Michael DiBattista, Qualcomm, Inc.
11:15 AM
19.3
The Changing Role of Advanced Sample Preparation in X-ray Inspection Supporting 2.5D and 3D Sample Failure Analysis
Ms. Rosanne M. LaVoy, SVXR; Mr. Matthew M. Mulholland, Intel Corporation; Mr. Scott Silverman, Varioscale, Inc
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