3.1
Near field EMC scanning method based on an E-field collapse method

Monday, November 2, 2015: 1:00 PM
Meeting Room D139 & 140 (Oregon Convention Center )
Mr. Jeffrey C. Dunnihoo , Pragma Design, Inc., Bertram, TX
Mr. Pasi Tamminen , Microsoft, Redmond, WA
Mr. Toni Viheriäkoski , Cascade Metrology, Lohja, Finland

Summary:

In this study we present a novel method to use a field collapse method together with fully automated near field scanning equipment to construct E- and H-field information of a system during transient ESD events. This inexpensive method provides an alternative way for system designers to validate and analyze the EMC/ESD capability of electronic systems without TLP pulsers, ESD simulators, or precision inductive current probes.
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