5.1
Comparison of Photon and Thermal Emission microscopy for Dynamic Fault Isolation
Comparison of Photon and Thermal Emission microscopy for Dynamic Fault Isolation
Monday, November 2, 2015: 1:50 PM
Meeting Room D139 & 140 (Oregon Convention Center )
Summary:
We seek to demonstrate the merits of thermal microscopy over photon emission in terms of sensitivity and precision for dynamic fault localization on a 28 nm analog test circuit.
We seek to demonstrate the merits of thermal microscopy over photon emission in terms of sensitivity and precision for dynamic fault localization on a 28 nm analog test circuit.