5.1
Comparison of Photon and Thermal Emission microscopy for Dynamic Fault Isolation

Monday, November 2, 2015: 1:50 PM
Meeting Room D139 & 140 (Oregon Convention Center )
Dr. SH Goh , GLOBALFOUNDRIES, Singapore, Singapore

Summary:

We seek to demonstrate the merits of thermal microscopy over photon emission in terms of sensitivity and precision for dynamic fault localization on a 28 nm analog test circuit.
See more of: Fault Isolation II
See more of: Technical Program