Mr. Norimichi Chinone
Mr. Norimichi Chinone
Student
Tohoku University
Research Institute of Electrical Communication
2-1-1, Katahira, Aoba-ku
Sendai
Japan
980-8577
Papers:
34.3
Carrier redistribution analysis of gate-biased SiC power-MOSFET using super-higher-order scanning nonlinear dielectric microscopy
34.4
Observation of polarization and two dimensional electron gas in AlGaN/GaN heterostructure using scanning nonlinear dielectric microscopy