Ms. Ching-Shan Sung

team Leader
Inotera Memories, Inc.
Physical Failure Analysis Department
Hwa-Ya Technology Park 667, Fuhsing 3rd Rd., Kueishan
Taoyuan Taiwan 33383

Papers:
33.1 TEM sample preparation tricks for Advanced DRAMs 34.1 Case Study: Doping Profile Analysis for 30nm DRAM Devices Using SCM and SSRM