Sinjin Dixon-Warren

Chipworks Inc.
Ottawa, ON
Canada K2H 5B7

Papers:
3.2 Extending Electrical Scanning Probe Microscopy Measurements of Semiconductor Devices using Microwave Impedance Microscopy 16.2 Plasma FIB DualBeam™ Delayering for Atomic Force nanoProbing™ of 14 nm FinFET Devices in an SRAM Array