15
Device FA

Wednesday, November 4, 2015: 4:45 PM-6:00 PM
Meeting Room D139 & 140 (Oregon Convention Center )
Session Chairs:  Ms. Victoria Bruce, Qualcomm Incorporated, San Diego, CA and Mr. Ted Kolasa, Orbital Sciences Corporation, Chandler, AZ
4:45 PM
15.1
A Case Study: Improving FIB Passive Voltage Contrast Imaging for Deep N-well Circuits
Mr. Randal E. Mulder, Silicon Labs
5:10 PM
15.2
Fault Isolation and TEM Study in the State-Of-Art Thin-Film Transistor
Dr. Yongkai Zhou, WinTech Nano-Technology Services Pte. Ltd.; Ms. Shik Lin Lee, WinTech Nano-Technology Services Pte. Ltd.; Mr. Chao Fu, WinTech Nano-Technology Services Pte. Ltd.; Dr. Younan Hua, WinTech Nano-Technology Services Pte. Ltd.; Mr. Xiaomin Li, WinTech Nano-Technology Services Pte. Ltd.
5:35 PM
15.3
Analysis approach on DMOS transistor Vth mismatch due to trapped charges
Mr. Ismail Hashim, Infineon Technologies (Kulim) Sdn. Bhd.; Mr. Chung Keow Ang, Infineon Technologies (Kulim) Sdn. Bhd.; Mr. Chye Siong Kenny Gan, Infineon Technologies AG
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