22
3D Devices Failure Analysis - Poster

Wednesday, November 4, 2015: 1:30 PM-3:30 PM
Exhibit Hall D (Oregon Convention Center )
Session Chairs:  Mr. Frank Altmann, Center for Applied Microstructure Diagnostics (CAM), Fraunhofer Institute for Mechanics of Materials, Halle, Germany and Dr. Yan Li, Intel, Chandler, AZ
22.1
MOFM : Magneto-Optical Frequency Mapping system for very low resistance short failure current imaging
Dr. Tomonori nakamura, Hamamatsu Photonics
See more of: Technical Program
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