23
Case Studies and FA Process - Posters

Wednesday, November 4, 2015: 1:30 PM-3:30 PM
Exhibit Hall D (Oregon Convention Center )
Session Chairs:  Dr. Zhigang Song, GLOBALFOUNDRIES, Hopewell Junction, NY and Ms. Rose Ring, Characterization, GLOBALFOUNDRIES Malta, Saratoga Springs, NY
23.1
A Case Study of Failure Analysis on ESD-induced Degradation of 405nm LD
Prof. Hongmin Liu, National Space Science Center, Chinese Academy of Sciences
23.2
Failure Analysis of Embedded Non-Volatile Memory with Nano- and Micro-Probing Techniques
N/A Xiang-Dong Wang, Freescale Semiconductor, Inc.; N/A Ping Wang, Freescale Semiconductor, Inc.; N/A Arnold Yazzie, Freescale Semiconductor, Inc.; N/A Laurel Will, Freescale Semiconductor, Inc.; N/A John Buchert, Freescale Semiconductor, Inc.; N/A Scott Guisinger, Freescale Semiconductor, Inc.
23.3
Magnetic Current Imaging Power Short Localization
Dr. Antonio Orozco, Neocera; Ms. Florencia Rusli, Avago; N/A MengChi Pun, Avago
See more of: Technical Program
<< Previous Session | Next Session >>