24
Device FA - Posters

Wednesday, November 4, 2015: 1:30 PM-3:30 PM
Exhibit Hall D (Oregon Convention Center )
Session Chairs:  Mr. Ted Kolasa, Orbital Sciences Corporation, Chandler, AZ and Ms. Victoria Bruce, Qualcomm Incorporated, San Diego, CA
24.1
Failure Analysis Induced by Bit Line Sense Amplifier Noise in High Density DRAM
Mr. Myungjae Lee, Samsung Electronics
24.2
Analysis of Write Recovery Time Degradation Caused by Adjacent Storage Node Data in DRAM
Mr. Kwangwon Lee, Samsung Electronics,Co.,Ltd
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