Electrical and Yield

Sunday, November 1, 2015: 8:00 AM-2:00 PM
Meeting Room D137 & 138 (Oregon Convention Center )
Session Chairs:  Dr. Jenny Ma, Intel, Chandler, AZ and Mr. Gregory M. Johnson, Physical Failure Analysis, GLOBALFOUNDRIES, Hopewell Junction, NY
8:00 AM
Accelerating Yield Ramp Using Wafer-level Dynamic Fault Isolation Approach
Dr. SH Goh, GLOBALFOUNDRIES
9:00 AM
The Role of Nanoprobing in Yield and Failure Analysis
Mr. Randal E. Mulder, Silicon Labs
10:00 AM
Break
10:30 AM
Yield Basics for FA
Mr. David Albert, IBM; Mr. Tracy Myers, ON Semiconductor
12:00 PM
Lunch
1:00 PM
What is new in 3D, digital testing?
Dr. Martin Keim, Mentor Graphics
See more of: Tutorial
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