Fault Isolation

Sunday, November 1, 2015: 8:00 AM-2:30 PM

Meeting Room D135 (Oregon Convention Center )

Session Chairs: Dr. Mayue Xie, Intel, Chandler, AZ and Mr. David Vallett, PeakSource Analytical, LLC, Fairfax, VT

8:00 AM

Defect localization by Lock-in-Thermography
Mr. Frank Altmann, Fraunhofer Institute for Mechanics of Materials

9:00 AM

Photonic Localization Techniques
Prof. Christian Boit, Berlin University of Technology; Dr. Arkadiusz Glowacki, Berlin University of Technology

10:00 AM

Break

10:30 AM

FA technique selection for front end defect localization in bulk semiconductor (Si) FA
Mr. Gregory M. Johnson, GLOBALFOUNDRIES; Mr. Christopher D'Aleo, GLOBALFOUNDRIES

12:00 PM

Lunch

1:00 PM

LADA and SDL: Powerful Techniques for Marginal Failures
Mr. Dan Bodoh, Freescale Semiconductor; Mr. Kent Erington, Freescale Semiconductor

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