Device FA

Monday, November 7, 2016: 12:35 PM-2:15 PM
113 (Fort Worth Convention Center)
Chairs:  Mr. Phil Kaszuba, 967H, Globalfoundries, Essex Junction, VT
Co-chairs:  Mr. Terence Kane, IBM, Hopewell Junction, NY
12:35 PM
Enhanced Localization of Non Linear Defects in Sub 14nm BEOL Structures
Mr. Terence Kane, IBM; Mr. Michael Tenney, IBM
1:00 PM
Study of 1340 nm continuous emission laser invasiveness on 28 nm advanced technologies
Mr. Maxime Penzes, ST Microelectronics Crolles 2; Mr. Sylvain DUDIT, ST Microelectronics Crolles 2; Mr. Michel Vallet, ST Microelectronics Crolles 2; Mr. Thierry Parrassin, ST Microelectronics Crolles 2; Prof. Dean Lewis, IMS laboratory, University of Bordeaux; Dr. Philippe Perdu, CNES - French Space Agency
1:25 PM
Complex Waveform Analysis for Advanced CMOS ICs
Mr. Eli Abuayob, Intel Corp; Dr. Baohua Niu, Intel Corp.; Mr. Evgeny Nisenboim, Intel Corp; Dr. Amir Raveh, Intel Corp; Dr. Tom X. Tong, Intel Corp.
1:50 PM
Analysis of an Asynchronously Generated Race Condition
Mr. Clifford Howard, NXP Semiconductors; Mr. Kent Erington, NXP Semiconductors; Mr. Kristofor Dickson, NXP Semiconductors
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