42nd International Symposium for Testing and Failure Analysis (November 6-10, 2016)
November 06 - 10, 2016
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Fault Isolation of DQ Failures in 14nm SRAM using Laser Voltage Imaging and Probing
Wednesday, November 9, 2016
Dr. Keith A. Serrels
,
GLOBALFOUNDRIES, Malta, NY
Mr. Anoop Kalarikkal
,
GLOBALFOUNDRIES, Malta, NY
Mr. Amit. M Jakati
,
GLOBALFOUNDRIES, Malta, NY
Mr. Greg Dabney
,
GLOBALFOUNDRIES, Malta, NY
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Fault Isolation - Poster
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