Fault Isolation - Poster

Wednesday, November 9, 2016: 1:30 PM-3:30 PM
Chairs:  Dr. Michael Bruce, Consultant, Austin, TX
Co-chairs:  Dr. Paiboon Tangyunyong, Validation and Failure Analysis, Sandia National Laboratories, Albuquerque, NM
Investigation of Radiation-Induced Response in Advanced Microprocessor
Dr. Dobrin P. Bossev, NSWC Crane; Adam R. Duncan, NSWC Crane; Dr. Matthew J. Gadlage, NSWC Crane; Dr. Austin H. Roach, NSWC Crane; Matthew J. Kay, NSWC Crane; Carl M. Szabo, AS&D Inc.; Tammy J. Berger, NSWC Crane; Darin A. York, NSWC Crane; Aaron Williams, NSWC Crane; Kenneth A. LaBel, NASA/GSFC; James D. Ingalls, NSWC Crane
Validation of DLS data by LVP in case of marginal failure
Mr. Keonil Kim, Samsung Electroncs S.LSI division
Fault Isolation of DQ Failures in 14nm SRAM using Laser Voltage Imaging and Probing
Dr. Keith A. Serrels, GLOBALFOUNDRIES; Mr. Anoop Kalarikkal, GLOBALFOUNDRIES; Mr. Amit. M Jakati, GLOBALFOUNDRIES; Mr. Greg Dabney, GLOBALFOUNDRIES
See more of: Technical Program
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