Characterization of 14nm Silicon Integrated Circuits with 1.55 – 2um Emission Microscopy: A Case Study

Wednesday, November 9, 2016: 5:10 PM
108 (Fort Worth Convention Center)
Dr. Keith A. Serrels , GLOBALFOUNDRIES, Malta, NY
Mr. Anoop Kalarikkal , GLOBALFOUNDRIES, Malta, NY
Mr. Amit M. Jakati , GLOBALFOUNDRIES, Malta, NY
Dr. Christian Schmidt , GLOBALFOUNDRIES, Malta, NY
Mr. Greg Dabney , GLOBALFOUNDRIES, Malta, NY

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See more of: Technical Program