Direct charge measurement in Floating Gate transistors of Flash EEPROM using Scanning Electron Microscopy

Tuesday, November 8, 2016: 3:20 PM
110AB (Fort Worth Convention Center)
Dr. Franck Courbon , University of Cambridge, Cambridge, United Kingdom
Dr. Sergei Skorobogatov , University of Cambridge, Cambridge, United Kingdom
Mr. Christopher Woods , Quo Vadis Labs, London, United Kingdom

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