Failure Analysis Work Flow for Dislocation Identification and Characterization by Electron Channeling Contrast Imaging using SEM and FIB
Failure Analysis Work Flow for Dislocation Identification and Characterization by Electron Channeling Contrast Imaging using SEM and FIB
Wednesday, November 9, 2016: 4:20 PM
110AB (Fort Worth Convention Center)
Summary:
This work presents a fast and cost effective method for dislocation identification and characterization in SEM and FIB using ECCI. A FA work flow of dislocation identification, site-specific lamella preparation at the target dislocation and STEM dislocation characterization is presented.
This work presents a fast and cost effective method for dislocation identification and characterization in SEM and FIB using ECCI. A FA work flow of dislocation identification, site-specific lamella preparation at the target dislocation and STEM dislocation characterization is presented.