High resolution x-ray computed tomography : what synchrotron sources can bring to 3Di devices failure analysis
Wednesday, November 9, 2016: 8:50 AM
108 (Fort Worth Convention Center)
Ms. Alexandra fraczkiewicz
,
CEA, LETI, MINATEC Campus, Grenoble, France
Dr. Ennio Capria
,
ESRF, Grenoble, France
Dr. Peter Cloetens
,
ESRF, Grenoble, France
Dr. Julio Da silva
,
ESRF, Grenoble, France
Dr. Amandine Jouve
,
Univ. Grenoble Alpes, Grenoble, France
Dr. Sandrine Lhostis
,
STMicroelectronics, Crolles, France
Dr. Frederic Lorut
,
STMicroelectronics, Crolles, France
Thierry Mourier
,
Univ. Grenoble Alpes, Grenoble, France
Dr. Pierre Bleuet
,
Univ. Grenoble Alpes, Grenoble, France
