42nd International Symposium for Testing and Failure Analysis (November 6-10, 2016): Analysis of SRAM Function Failure Due to Unformed CoSi2 Using Nano-prober and Transmission Electron Microscopy(TEM)

Analysis of SRAM Function Failure Due to Unformed CoSi2 Using Nano-prober and Transmission Electron Microscopy(TEM)

Wednesday, November 9, 2016

Mr. Jong Eun Kim , SK Hynix semiconductor Inc., Cheongju, South Korea

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