Implementing Time Resolved Laser Assisted Device Alteration using Pulse-on-demand nanosecond Laser Diode
Implementing Time Resolved Laser Assisted Device Alteration using Pulse-on-demand nanosecond Laser Diode
Thursday, November 10, 2016: 9:15 AM
108 (Fort Worth Convention Center)
Summary:
Time resolved soft defect localization (TR-SDL) has interesting applications to reduce the spread of SDL site, as well as benefit design debug. This particular paper describes a simple implementation with a 1064nm nanosecond pulse-at-will laser diode and obtain time resolution to 1-2 tester cycles while observing a sharper SDL site as well as helping in analog debug applications
Time resolved soft defect localization (TR-SDL) has interesting applications to reduce the spread of SDL site, as well as benefit design debug. This particular paper describes a simple implementation with a 1064nm nanosecond pulse-at-will laser diode and obtain time resolution to 1-2 tester cycles while observing a sharper SDL site as well as helping in analog debug applications