Implementing Time Resolved Laser Assisted Device Alteration using Pulse-on-demand nanosecond Laser Diode

Thursday, November 10, 2016: 9:15 AM
108 (Fort Worth Convention Center)
Mr. Venkat Ravikumar , Advanced Micro Devices - Singapore Pte Ltd, Singapore, Singapore
SL Phoa , Advanced Micro Devices - Singapore Pte Ltd, Singapore, Singapore
Mr. Gopinath ranganathan , Advanced Micro Devices - Singapore Pte Ltd1, Singapore, Singapore
JM Chin , Advanced Micro Devices - Singapore Pte Ltd, Singapore, Singapore
Prof. KL pey , Singapore University of Technology and Design, Singapore, Singapore
Prof. KW yang , Singapore University of Technology and Design, Singapore, Singapore
Mr. WL Kok , Einst Technology Pte Ltd, Singapore, Singapore
Koh Lian Ser , Semicaps Pte Ltd, n/a, Singapore

Summary:

Time resolved soft defect localization (TR-SDL) has interesting applications to reduce the spread of SDL site, as well as benefit design debug. This particular paper describes a simple implementation with a 1064nm nanosecond pulse-at-will laser diode and obtain time resolution to 1-2 tester cycles while observing a sharper SDL site as well as helping in analog debug applications
See more of: Fault Isolation I
See more of: Technical Program