Fault Isolation I

Thursday, November 10, 2016: 8:00 AM-9:40 AM
108 (Fort Worth Convention Center)
Chairs:  Dr. Michael Bruce, Consultant, Austin, TX
Co-chairs:  Dr. Paiboon Tangyunyong, Validation and Failure Analysis, Sandia National Laboratories, Albuquerque, NM
8:00 AM
Automated Emission Data Registration and Segmentation for IC Analysis
Dr. Franco Stellari, IBM Research; Dr. Peilin Song, IBM T.J. Watson Research Center
8:25 AM
Use of Second Harmonic and Thermal effects of Laser Voltage Probing for better Fault isolation
Dr. Ramya Yeluri, Intel Co.; Ravishankar Thirugnanasambandam, Intel Co.; Cameron Wagner, Intel Co.; Jonathan Urtecho, Intel Co.; Jan Neirynck, Intel Co.
8:50 AM
Enhanced Static Fault Localization Methodology on Resistive Open Defects using Photon Emission Microscopy and Layout Defect Prediction
Dr. Alfred C.T. Quah, GLOBALFOUNDRIES Singapore Pte Ltd; Mr. D. Nagalingam, GLOBALFOUNDRIES Singapore Pte Ltd; Mr. G. B. Ang, GLOBALFOUNDRIES Singapore Pte Ltd; Dr. C.Q. Chen, GLOBALFOUNDRIES Singapore Pte Ltd; Dr. S.J. Moon, GLOBALFOUNDRIES Singapore Pte Ltd; Mr. E. Susanto, GLOBALFOUNDRIES Singapore Pte Ltd; H.H. Ma, GLOBALFOUNDRIES Singapore Pte Ltd; Ms. S.P. Neo, GLOBALFOUNDRIES Singapore Pte Ltd; Dr. J.C. Lam, GLOBALFOUNDRIES Singapore Pte Ltd; Dr. Z.H. Mai, GLOBALFOUNDRIES Singapore Pte Ltd
9:15 AM
Implementing Time Resolved Laser Assisted Device Alteration using Pulse-on-demand nanosecond Laser Diode
Mr. Venkat Ravikumar, Advanced Micro Devices - Singapore Pte Ltd; SL Phoa, Advanced Micro Devices - Singapore Pte Ltd; Mr. Gopinath ranganathan, Advanced Micro Devices - Singapore Pte Ltd1; JM Chin, Advanced Micro Devices - Singapore Pte Ltd; Prof. KL pey, Singapore University of Technology and Design; Prof. KW yang, Singapore University of Technology and Design; Mr. WL Kok, Einst Technology Pte Ltd; Koh Lian Ser, Semicaps Pte Ltd
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