42nd International Symposium for Testing and Failure Analysis (November 6-10, 2016)
November 06 - 10, 2016
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Poly Undercut Induced Device Asymmetric Failure
Wednesday, November 9, 2016
Mr. Wen Hui Wang
,
United Microelectronics Corporation, HsinChu Science Park,, Taiwan
Chun-Cheng Tsao
,
SMIC, Shanghai, China
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Nanoprobing and Electrical Characterization - Poster
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