Multi-Photon OBIC for Device characterization and Defect Localization

Thursday, November 10, 2016: 12:55 PM

110AB (Fort Worth Convention Center)

Mr. Gregory M. Johnson , GLOBALFOUNDRIES, Hopewell Junction, NY

Dr. Ziyan Xu , GLOBALFOUNDRIES, Hopewell Junction, NY

Mr. Lloyd Smith , GLOBALFOUNDRIES, Hopewell Junction, NY

Dr. Tomonori nakamura , Hamamatsu Photonics, hamamatsu, Japan

Summary:

Multi-photon Optical Beam Induced Current examined on device and ring oscillators

See more of: Fault Isolation II
See more of: Technical Program