Thursday, November 10, 2016: 12:55 PM-2:20 PM
110AB (Fort Worth Convention Center)
Chairs: Dr. Michael Bruce, Consultant, Austin, TX
Co-chairs: Dr. Paiboon Tangyunyong, Validation and Failure Analysis, Sandia National Laboratories, Albuquerque, NM
1:20 PM
Optimization of EeLADA for Circuit Logic Defect Localization Using Defect Simulation
Mr. Boon Lian Yeoh, GLOBALFOUNDRIES Singapore Pte Ltd;
Dr. SH Goh, GLOBALFOUNDRIES Singapore Pte Ltd;
Dr. Guofeng You, GLOBALFOUNDRIES Singapore Pte Ltd;
Mr. Alan Tan, GLOBALFOUNDRIES Singapore Pte Ltd;
Mr. Ying Hong Chan, GLOBALFOUNDRIES Singapore Pte Ltd;
Ms. Lin Zhao, GLOBALFOUNDRIES Singapore Pte Ltd;
Ms. Hnin Hnin Win Thoungh MA, GLOBALFOUNDRIES Singapore Pte Ltd;
Mr. Ang Ghim Boon, GLOBALFOUNDRIES Singapore Pte Ltd;
Dr. Lam Jeffrey, GLOBALFOUNDRIES Singapore Pte Ltd;
Mr. Hao Hu, GLOBALFOUNDRIES Singapore Pte Ltd;
Mr. Varun Gupta, GLOBALFOUNDRIES Singapore Pte Ltd;
Chee-Chun Tay, Mentor Graphics Corporation
