Finfet SRAM Bitmap Validation Using Near Infrared Laser-Induced Damage

Monday, November 7, 2016: 9:35 AM
121AB (Fort Worth Convention Center)
Dr. William Lo , NVIDIA, Santa Clara, CA
Puneet Gupta , NVIDIA, Santa Clara, CA
Rakshith Venkatesh , NVIDIA, Santa Clara, CA
Dr. Rudolf Schlangen , NVIDIA, Santa Clara, CA
Roy Ng , NVIDIA, Santa Clara, CA
Dr. Yuanjing (Jane) Li , NVIDIA, Santa Clara, CA
Howard Lee Marks , NVIDIA, Santa Clara, CA
Bruce Cory , NVIDIA, Santa Clara, CA

Summary:

Using a laser to purposely damage (or zap) a static random-access memory (SRAM) bitcell for bitmap validation purposes is a well-established technique. However, the absence of visible damage in Finfet SRAM cells, amongst other things, makes precision zapping in these devices more difficult. In this paper, we describe system enhancements and a modified workflow for bitmap validation of these devices using precision near-infrared laser-induced damage.