Emerging FA Techniques and Concepts

Monday, November 7, 2016: 9:35 AM-11:40 AM
121AB (Fort Worth Convention Center)
Chairs:  Dr. Jeffrey Lam, Technology Development- New Technology Prototyping, Global Foundries, Singapore, Singapore
Co-chairs:  Mr. Dan Bodoh, Product Diagnostic Center, NXP Semiconductors, Austin, TX
9:35 AM
Finfet SRAM Bitmap Validation Using Near Infrared Laser-Induced Damage
Dr. William Lo, NVIDIA; Puneet Gupta, NVIDIA; Rakshith Venkatesh, NVIDIA; Dr. Rudolf Schlangen, NVIDIA; Roy Ng, NVIDIA; Dr. Yuanjing (Jane) Li, NVIDIA; Howard Lee Marks, NVIDIA; Bruce Cory, NVIDIA
10:00 AM
Contactless Fault Isolation for FinFET Technologies with Visible Light and GaP SIL
Mr. Heiko Lohrke, TUB Technische Universitaet Berlin; Dr. Philipp Scholz, TUB Technische Universitaet Berlin; Mrs. Anne Beyreuther, TUB Technische Universitaet Berlin; Dr. Ulrike Ganesh, Qualcomm Technologies, Inc; Prof. Eckart Uhlmann, TUB Technische Universitaet Berlin; Mr. Stefan Kuehne, TUB Technische Universitaet Berlin; Mr. Marco Jagodzinski, TUB Technische Universitaet Berlin; Mr. Yoshitaka Iwaki, Hamamatsu Photonics Deutschland GmbH; Prof. Christian Boit, TUB Technische Universitaet Berlin; Dr. Robert D. Chivas, Sandia National Laboratories; Mr. Scott Silverman, Varioscale, Inc
10:50 AM
LASER VOLTAGE TRACING: A NOVEL APPROACH FOR IMAGING PULSED SIGNALS
Mr. Christopher Nemirow, Ph.D, FEI Company; Mr. Neel Leslie, FEI Company
11:15 AM
Pushing the resolution of time-integrated emission images beyond the diffraction limit using image deconvolution
Ms. Fei Lan, University of Pittsburgh; Dr. Franco Stellari, IBM Research; Dr. Andrea Bahgat Shehata, IBM T.J. Watson Research Center; Dr. Peilin Song, IBM T.J. Watson Research Center
See more of: Technical Program