Contactless Fault Isolation for FinFET Technologies with Visible Light and GaP SIL

Monday, November 7, 2016: 10:00 AM

121AB (Fort Worth Convention Center)

Mr. Heiko Lohrke , TUB Technische Universitaet Berlin, Berlin, Germany

Dr. Philipp Scholz , TUB Technische Universitaet Berlin, Berlin, Germany

Mrs. Anne Beyreuther , TUB Technische Universitaet Berlin, Berlin, Germany

Dr. Ulrike Ganesh , Qualcomm Technologies, Inc, San Diego, CA

Prof. Eckart Uhlmann , TUB Technische Universitaet Berlin, Berlin, Germany

Mr. Stefan Kuehne , TUB Technische Universitaet Berlin, Berlin, Germany

Mr. Marco Jagodzinski , TUB Technische Universitaet Berlin, Berlin, Germany

Mr. Yoshitaka Iwaki , Hamamatsu Photonics Deutschland GmbH, Herrsching, Germany

Prof. Christian Boit , TUB Technische Universitaet Berlin, Berlin, Germany

Dr. Robert D. Chivas , Sandia National Laboratories, Albuquerque, NM

Mr. Scott Silverman , Varioscale, Inc, San Marcos, CA