42nd International Symposium for Testing and Failure Analysis (November 6-10, 2016)
November 06 - 10, 2016
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Advanced X-Ray Inspection Techniques for IC Reverse Engineering
Tuesday, November 8, 2016: 2:55 PM
110AB (Fort Worth Convention Center)
Ms. Rosanne M. LaVoy
,
SVXR, San Jose, CA
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Reverse Engineering II
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Technical Program