42nd International Symposium for Testing and Failure Analysis (November 6-10, 2016)
November 06 - 10, 2016
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Advanced X-Ray Inspection Techniques for Counterfeit IC Detection
Thursday, November 10, 2016: 11:05 AM
108 (Fort Worth Convention Center)
Ms. Rosanne M. LaVoy
,
SVXR, San Jose, CA
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Detecting and Preventing Counterfeit Microelectronics
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Technical Program