Detecting and Preventing Counterfeit Microelectronics

Thursday, November 10, 2016: 9:50 AM-11:55 AM

108 (Fort Worth Convention Center)

Chairs: Dr. Navid Asadi, Electrical and Computer Engineering, University of Florida, Gainesville, FL

Co-chairs: Mr. Michael D. Woo, Raytheon, El Segundo, CA

9:50 AM

INVITED TALK: Mitigating Hardware Security Threats
Dr. Yaw Obeng, National Institute of Standards and Technology (NIST)

10:15 AM

A Database for Counterfeit Electronics and Automatic Defect Detection Based on Image processing and Machine Learning
Prof. Navid Asadizanjani, PhD, University of Florida; Mr. Sachin G Gattigowda, University of Florida; Mr. Nathan Dunn, University of Massachusets Lowell; Prof. Mark Tehranipoor, PhD, University of Florida; Prof. Domenic Forte, PhD, University of Florida

10:40 AM

Non-destructive Bond Pull and Ball Shear Failure Analysis Based on Real Structural Properties
Prof. Navid Asadizanjani, PhD, University of Florida; Prof. Domenic Forte, PhD, University of Florida; Prof. Mark Tehranipoor, PhD, University of Florida

11:05 AM

11:30 AM

Authentication of Printed Circuit Boards
Mr. Anirudh Srikant Iyengar, University of South Florida; Dr. Swaroop Ghosh, University of South Florida

See more of: Technical Program