42nd International Symposium for Testing and Failure Analysis (November 6-10, 2016): INVITED TALK: Survey of common AFM electrical modes used in semiconductor Failure Analysis with further discussion of novel electrical modes that extend the capabilities for high resolution device characterization

INVITED TALK: Survey of common AFM electrical modes used in semiconductor Failure Analysis with further discussion of novel electrical modes that extend the capabilities for high resolution device characterization

Wednesday, November 9, 2016: 9:15 AM

110AB (Fort Worth Convention Center)

Mr. Oskar Amster , PrimeNano, Inc., Palo Alto, CA

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